Materials Characterisation by the Combined Analysis
This international school will cover many aspects of the “Combined Analysis” by X-ray, neutron and electron scattering and X-ray fluorescence applied to material science, ranging from fundamental requirements to technically relevant industrial and academic applications. The combined analysis method has been developed over the years starting from the Rietveld method, extending it to most of the powder diffraction analyses and more recently incorporating, on the same idea, other techniques such as reflectivity, X-ray fluorescence and electron diffraction.
The aim is to give students as well as academic and non-academic researchers the necessary information and tools to be able to characterise their own materials and samples using the combined analysis method and the software MAUD. The characterisation involves obtaining information on the structure, microstructure, phase and elemental content, texture, stress in different kind of samples and structures including: thin films, bulk materials, anisotropic materials, poly-phased materials, nano-materials, etc.
Each type of analysis will be considered individually for the proper technique and then integrated into a combined analysis program. Some specific examples will be studied using X-ray, electron and neutron experimental data.
The objective is to bring together participants from various fields and to provide an opportunity to discuss individual interests and experience.
XRD, XRF and electron microscopy equipment available at the Dipartimento Ingegneria Industriale (DII) and Fondazione Bruno Kessler (FBK) will be used to demonstrate technical aspects and to support the theoretical and practical issues of this course. Several exercises will be performed with the MAUD and related software directly at the computer.